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A USAF 1951 resolution chart in PDF format is provided by Yoshihiko Takinami. This chart should be printed such that the side of the square of the 1st element of the group -2 should be 10 mm long. USAF 1951 Resolution Target Further explanations and examples; Koren 2003: Norman Koren's updated resolution chart better suited for computer analysis
The spectral resolution of a spectrograph, or, more generally, of a frequency spectrum, is a measure of its ability to resolve features in the electromagnetic spectrum.It is usually denoted by , and is closely related to the resolving power of the spectrograph, defined as =, where is the smallest difference in wavelengths that can be distinguished at a wavelength of .
The ability of a lens to resolve detail is usually determined by the quality of the lens, but is ultimately limited by diffraction.Light coming from a point source in the object diffracts through the lens aperture such that it forms a diffraction pattern in the image, which has a central spot and surrounding bright rings, separated by dark nulls; this pattern is known as an Airy pattern, and ...
FWHM is applied to such phenomena as the duration of pulse waveforms and the spectral width of sources used for optical communications and the resolution of spectrometers. The convention of "width" meaning "half maximum" is also widely used in signal processing to define bandwidth as "width of frequency range where less than half the signal's ...
The terminology is also applied to indirect measurements—that is, values obtained by a computational procedure from observed data. In addition to accuracy and precision, measurements may also have a measurement resolution, which is the smallest change in the underlying physical quantity that produces a response in the measurement.
The closely related term spatial resolution refers to the precision of a measurement with respect to space, which is directly connected to angular resolution in imaging instruments. The Rayleigh criterion shows that the minimum angular spread that can be resolved by an image-forming system is limited by diffraction to the ratio of the ...
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
A high value for resolution corresponding to good separation of peaks is similar to the convention used with chromatography separations, [13] although it is important to note that the definitions are not the same. [14] High resolution indicating better peak separation is also used in ion mobility spectrometry. [15]