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  2. Le Bail method - Wikipedia

    en.wikipedia.org/wiki/Le_Bail_method

    Initially, peak positions are found in the data. Next, the pattern is indexed in order to determine the unit cell or lattice parameters. Then, space group determination follows based on symmetry and the presence or absence of certain reflections. Then, either Le Bail or Pawley technique may be used to extract intensities and refine the unit cell.

  3. Crystallographic database - Wikipedia

    en.wikipedia.org/wiki/Crystallographic_database

    The algorithm searches for matches within a certain range of the lattice parameters. More accurate lattice parameters allow a narrower range and, thus, a better match. [31] Lattice matching is useful in identifying crystal phases in the early stages of single-crystal diffraction experiments and, thus, avoiding unnecessary full data collection ...

  4. Vegard's law - Wikipedia

    en.wikipedia.org/wiki/Vegard's_law

    Vegard's law assumes that both components A and B in their pure form (i.e., before mixing) have the same crystal structure. Here, a A (1-x) B x is the lattice parameter of the solid solution, a A and a B are the lattice parameters of the pure constituents, and x is the molar fraction of B in the solid solution.

  5. Lattice constant - Wikipedia

    en.wikipedia.org/wiki/Lattice_constant

    Unit cell definition using parallelepiped with lengths a, b, c and angles between the sides given by α, β, γ [1]. A lattice constant or lattice parameter is one of the physical dimensions and angles that determine the geometry of the unit cells in a crystal lattice, and is proportional to the distance between atoms in the crystal.

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.

  7. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.

  8. Miller index - Wikipedia

    en.wikipedia.org/wiki/Miller_index

    This is based on the fact that a reciprocal lattice vector (the vector indicating a reciprocal lattice point from the reciprocal lattice origin) is the wavevector of a plane wave in the Fourier series of a spatial function (e.g., electronic density function) which periodicity follows the original Bravais lattice, so wavefronts of the plane wave ...

  9. Tetragonal crystal system - Wikipedia

    en.wikipedia.org/wiki/Tetragonal_crystal_system

    An example of the tetragonal crystals, wulfenite Two different views (top down and from the side) of the unit cell of tP30-CrFe (σ-phase Frank–Kasper structure) that show its different side lengths, making this structure a member of the tetragonal crystal system. In crystallography, the tetragonal crystal system is one of the 7 crystal systems.