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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Evans and Calderwood used single cell force microscopy to study cell adhesion forces, bond kinetics/dynamic bond strength and its role in chemical processes such as cell signaling. [59] Scheuring, Lévy, and Rigaud reviewed studies in which AFM to explore the crystal structure of membrane proteins of photosynthetic bacteria. [60]
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-range force and can be ...
Force spectroscopy is a set of techniques for the study of the interactions and the binding forces between individual molecules. [1] [2] These methods can be used to measure the mechanical properties of single polymer molecules or proteins, or individual chemical bonds.
MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...
These instabilities can be avoided with displacement-controlled techniques, one of this is the interfacial force microscopy. [13] [19] [20] The tap can be at contact with the sample in the whole measurement process, and this is called contact mode (or static mode), otherwise it can be oscillated and this is called tapping mode (or dynamic mode).
Bimodal Atomic Force Microscopy (bimodal AFM) is an advanced atomic force microscopy technique characterized by generating high-spatial resolution maps of material properties. Topography, deformation, elastic modulus, viscosity coefficient or magnetic field maps might be generated.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.