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  2. Chroma ATE - Wikipedia

    en.wikipedia.org/wiki/Chroma_ATE

    Chroma ATE Inc. 致茂電子, is a Taiwanese electronic test and measurement instrumentation company founded in 1984. The company develops and manufactures a range of electronic test and measurement equipment, automated testing equipment (), signal generator, power supplies, and intelligent manufacturing execution systems ().

  3. List of free electronics circuit simulators - Wikipedia

    en.wikipedia.org/wiki/List_of_free_electronics...

    List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE.The following table is split into two groups based on whether it has a graphical visual interface or not.

  4. Programmable load - Wikipedia

    en.wikipedia.org/wiki/Programmable_load

    By virtue of being programmable, tests like load regulation, battery discharge curve measurement and transient tests can be fully automated and load changes for these tests can be made without introducing switching transient that might change the measurement or operation of the power source under test.

  5. Dummy load - Wikipedia

    en.wikipedia.org/wiki/Dummy_load

    An electronic load (or e-load) is a device or assembly that simulates loading on an electronic circuit. It is used as substitute for a conventional ohmic load resistor. Electronic loads with 800W and 4200W from Höcherl & Hackl. As counterpart to a current source, the electronic load is a current sink. When loading a current source with a fixed ...

  6. Load bank - Wikipedia

    en.wikipedia.org/wiki/Load_bank

    A load bank is a piece of electrical test equipment used to simulate an electrical load, to test an electric power source without connecting it to its normal operating load. [ 1 ] [ 2 ] During testing, adjustment, calibration, or verification procedures, a load bank is connected to the output of a power source, such as an electric generator ...

  7. Source measure unit - Wikipedia

    en.wikipedia.org/wiki/Source_measure_unit

    I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...

  8. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.

  9. Universal testing machine - Wikipedia

    en.wikipedia.org/wiki/Universal_testing_machine

    Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...