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5.1 Programming Manual Examples. ... such as automatic test equipment and electronic test equipment. ... Volume 1-4, 819 page PDF file, free download ...
Chroma ATE Inc. 致茂電子, is a Taiwanese electronic test and measurement instrumentation company founded in 1984. The company develops and manufactures a range of electronic test and measurement equipment, automated testing equipment (), signal generator, power supplies, and intelligent manufacturing execution systems ().
A programmable load is a type of test equipment or instrument which emulates DC or AC resistance loads normally required to perform functional tests of batteries, power supplies or solar cells.
A load bank is a piece of electrical test equipment used to simulate an electrical load, to test an electric power source without connecting it to its normal operating load. [ 1 ] [ 2 ] During testing, adjustment, calibration, or verification procedures, a load bank is connected to the output of a power source, such as an electric generator ...
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.
I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...
IEC 60068 is an international standard for the environmental testing of electrotechnical products that is published by the International Electrotechnical Commission (IEC).. IEC 60068 is a collection of methods [1] for environmental testing of electronic equipment and products to assess their ability to perform under environmental conditions including extreme cold and dry heat.
Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available.