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HALT is a test technique called test-to-fail, where a product is tested until failure. HALT does not help to determine or demonstrate the reliability value or failure probability in field. Many accelerated life tests are test-to-pass, meaning they are used to demonstrate the product life or reliability.
Kyocera helped AVX start manufacturing connectors. In 1995, Kyocera sold one-fourth of AVX for $557 million, which more than returned the company's investment in AVX, even though Kyocera still owned three-fourths of the company. AVX used the money to enter the connector business and increase its manufacturing of ceramic and tantalum capacitors.
2.0 Overview of Software Reliability Growth (Estimation) Models Software reliability growth (or estimation) models use failure data from testing to forecast the failure rate or MTBF into the future. The models depend on the assumptions about the fault rate during testing which can either be increasing, peaking, decreasing or some combination of ...
Kyocera acquired the terminal business of US digital communications technology company Qualcomm in February 2000, [17] and became a major supplier of mobile handsets. In 2008, Kyocera also took over the handset business of Sanyo, eventually forming 'Kyocera Communications, Inc.'. The Kyocera Communications terminal division is located in San Diego.
A prediction of reliability is an important element in the process of selecting equipment for use by telecommunications service providers and other buyers of electronic equipment, and it is essential during the design stage of engineering systems life cycle. [1] Reliability is a measure of the frequency of equipment failures as a function of time.
highly accelerated stress test is a Ongoing Reliability Test that uses the empirical operational limits as the reference for the combined vibration, thermal cycling, and other stress applied to find latent defects. Quality of the products is then measured with the results of this test.
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
RAMP Simulation Software for Modelling Reliability, Availability and Maintainability (RAM) is a computer software application developed by WS Atkins specifically for the assessment of the reliability, availability, maintainability and productivity characteristics of complex systems that would otherwise prove too difficult, cost too much or take too long to study analytically.