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Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
Tensile testing, also known as tension testing, [1] is a fundamental materials science and engineering test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength , breaking strength , maximum elongation and reduction in area. [ 2 ]
Hardware-in-the-loop (HIL) simulation, also known by various acronyms such as HiL, HITL, and HWIL, is a technique that is used in the development and testing of complex real-time embedded systems. HIL simulation provides an effective testing platform by adding the complexity of the process-actuator system, known as a plant , to the test platform.
The company operates in two divisions: Test and Sensors. In December 2020, Amphenol Corporation announced it had reached an agreement to acquire MTS in an acquisition completed on April 7, 2021. [2] [3] In January 2021, ITW announced it had in turn reached an agreement to acquire the test and simulation business of MTS from Amphenol in the ...
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Switzerland said on Tuesday it was concerned by U.S. President-elect Donald Trump's proposals to raise tariffs and is considering how to respond if his new administration does so. Trump aims to ...
Johnny Depp is warning about ongoing social media scams targeting his fan base.. The actor, 61, wished his followers on Instagram a "Happy New Year" on Monday, Jan. 6, while also alerting fans ...
Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit (IC).Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.