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Diffraction is the same physical effect as interference, but interference is typically applied to superposition of a few waves and the term diffraction is used when many waves are superposed. [1]: 433 Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660.
Because diffraction is the result of addition of all waves (of given wavelength) along all unobstructed paths, the usual procedure is to consider the contribution of an infinitesimally small neighborhood around a certain path (this contribution is usually called a wavelet) and then integrate over all paths (= add all wavelets) from the source to the detector (or given point on a screen).
Diffraction refers to various phenomena associated with wave propagation, such as the bending, spreading and interference of waves emerging from an aperture. Subcategories This category has the following 3 subcategories, out of 3 total.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
Some of the earliest work on what would become known as Fresnel diffraction was carried out by Francesco Maria Grimaldi in Italy in the 17th century. In his monograph entitled "Light", [3] Richard C. MacLaurin explains Fresnel diffraction by asking what happens when light propagates, and how that process is affected when a barrier with a slit or hole in it is interposed in the beam produced by ...
The dynamical theory of diffraction describes the interaction of waves with a regular lattice. The wave fields traditionally described are X-rays , neutrons or electrons and the regular lattice are atomic crystal structures or nanometer -scale multi-layers or self-arranged systems.
Close to an aperture or atoms, often called the "sample", the electron wave would be described in terms of near field or Fresnel diffraction. [12]: Chpt 7-8 This has relevance for imaging within electron microscopes, [1]: Chpt 3 [2]: Chpt 3-4 whereas electron diffraction patterns are measured far from the sample, which is described as far-field or Fraunhofer diffraction. [12]:
The Talbot effect is a diffraction effect first observed in 1836 by Henry Fox Talbot. [1] When a plane wave is incident upon a periodic diffraction grating, the image of the grating is repeated at regular distances away from the grating plane. The regular distance is called the Talbot length, and the repeated images are called self images or ...