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Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
The Zwick Roell Group is a manufacturer of static testing machines and systems for materials and components testing used to evaluate the mechanical and physical properties and performance of materials and components.
Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.
A universal testing machine (Hegewald & Peschke) The most common testing machine used in tensile testing is the universal testing machine. This type of machine has two crossheads; one is adjusted for the length of the specimen and the other is driven to apply tension to the test specimen. Testing machines are either electromechanical or ...
Probe cards or DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used. One type of DUT board is used for testing the individual die of a silicon wafer before they are cut free and packaged, and another type is used for testing packaged IC's.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
The Universal Verification Methodology (UVM) is a standardized methodology for verifying integrated circuit designs. UVM is derived mainly from OVM ( Open Verification Methodology ) which was, to a large part, based on the eRM (e Reuse Methodology) for the e verification language developed by Verisity Design in 2001.
Experimental broadcasts using the first three prototype versions of the UEIT (one of which was a modification of the Hungarian HTV TR.0782 test card; [9] but all were collectively referred to as UEIT-1) began from the Ostankino Tower transmitter in 1970, with results being used to create the current version of the test pattern.