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VHDL-1987,-1993,-2002,-2008, V2001, SV2005, SV2009, SV2012, SV2017: The original Modeltech (VHDL) simulator was the first mixed-language simulator capable of simulating VHDL and Verilog design entities together. In 2003, ModelSim 5.8 was the first simulator to begin supporting features of the Accellera SystemVerilog 3.0 standard. [1]
This collection of simulation models is commonly called a testbench. A VHDL simulator is typically an event-driven simulator. [13] This means that each transaction is added to an event queue for a specific scheduled time. E.g. if a signal assignment should occur after 1 nanosecond, the event is added to the queue for time +1ns.
An HDL simulator — the program that executes the testbench — maintains the simulator clock, which is the master reference for all events in the testbench simulation. Events occur only at the instants dictated by the testbench HDL (such as a reset-toggle coded into the testbench), or in reaction (by the model) to stimulus and triggering events.
In VHDL simulations, all assignments to signals (a VHDL concept that represents a net connecting different components together) occur with some infinitesimal delay, known as delta delay, unless a delay is specified. [1]
The IEEE 1164 standard (Multivalue Logic System for VHDL Model Interoperability) is a technical standard published by the IEEE in 1993.It describes the definitions of logic values to be used in electronic design automation, for the VHDL hardware description language. [2]
Hardware-in-the-loop (HIL) simulation, also known by various acronyms such as HiL, HITL, and HWIL, is a technique that is used in the development and testing of complex real-time embedded systems. HIL simulation provides an effective testing platform by adding the complexity of the process-actuator system, known as a plant , to the test platform.
A test bench or testing workbench is an environment used to verify the correctness or soundness of a design or model.. The term has its roots [citation needed] in the testing of electronic devices, where an engineer would sit at a lab bench with tools for measurement and manipulation, such as oscilloscopes, multimeters, soldering irons, wire cutters, and so on, and manually verify the ...
Path delay fault: This fault is due to the sum of all gate propagation delays along a single path. This fault shows that the delay of one or more paths exceeds the clock period. One major problem in finding delay faults is the number of possible paths in a circuit under test (CUT), which in the worst case can grow exponentially with the number ...