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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Mochii - Wikipedia

    en.wikipedia.org/wiki/Mochii

    Mochii is a miniature scanning electron microscope made by Seattle-based startup company Voxa. The Mochii has the same capabilities as a conventional SEM, such as usage in materials science for research purposes, microchip and semiconductor quality control, and medicine. [2] Mochii users are able to operate the microscope using an IOS app.

  4. Scanning electrochemical microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_electrochemical...

    Simultaneous experiments by Allen J. Bard using an Electrochemical Scanning Tunneling Microscope demonstrated current at large tip-to-sample distances that was inconsistent with electron tunneling. This phenomenon was attributed to Faradaic current, compelling a more thorough analysis of electrochemical microscopy. [14]

  5. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  6. Aberration-Corrected Transmission Electron Microscopy

    en.wikipedia.org/wiki/Aberration-Corrected...

    Scherzer's theorem is a theorem in the field of electron microscopy. It states that there is a limit of resolution for electronic lenses because of unavoidable aberrations. German physicist Otto Scherzer found in 1936 [1] that the electromagnetic lenses, which are used in electron microscopes to focus the electron beam, entail unavoidable ...

  7. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...

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