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  2. Mitutoyo - Wikipedia

    en.wikipedia.org/wiki/Mitutoyo

    Mitutoyo America Corporation was formed in 1963 and is headquartered in Aurora, Illinois (just outside Chicago).Mitutoyo America offers the full product line of precision measuring tools, instruments and equipment with a distribution network, training and education classes, software development, and service support to provide a comprehensive metrology organization.

  3. Micrometer (device) - Wikipedia

    en.wikipedia.org/wiki/Micrometer_(device)

    Universal micrometer sets come with interchangeable anvils, such as flat, spherical, spline, disk, blade, point, and knife-edge. The term universal micrometer may also refer to a type of micrometer whose frame has modular components, allowing one micrometer to function as outside mic, depth mic, step mic, etc. (often known by the brand names ...

  4. Micrometer - Wikipedia

    en.wikipedia.org/wiki/Micrometer

    Micrometer can mean: Micrometer (device), used for accurate measurements by means of a calibrated screw; Micrometre, a millionth of a metre

  5. Micrometer adjustment nut - Wikipedia

    en.wikipedia.org/wiki/Micrometer_adjustment_nut

    On a manual milling machine, the micrometer adjustment nut limits the depth to which the cutting tool may plunge into the workpiece. The nut is located on a threaded rod on the mill head. The machine operator moves it up or down by rotating it clockwise (to move it down) or counter-clockwise (to move it up).

  6. Micrometre - Wikipedia

    en.wikipedia.org/wiki/Micrometre

    The micrometre (Commonwealth English as used by the International Bureau of Weights and Measures; [1] SI symbol: μm) or micrometer (American English), also commonly known by the non-SI term micron, [2] is a unit of length in the International System of Units (SI) equalling 1 × 10 −6 metre (SI standard prefix "micro-" = 10 −6); that is, one millionth of a metre (or one thousandth of a ...

  7. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    This feedback loop has the cantilever deflection as input, and its output controls the distance along the z axis between the probe support (2 in fig. 3) and the sample support (8 in fig 3). As long as the tip remains in contact with the sample, and the sample is scanned in the x–y plane, height variations in the sample will change the ...

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