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  2. Scanning tunneling microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling_microscope

    The main components of a scanning tunneling microscope are the scanning tip, piezoelectrically controlled height (z axis) and lateral (x and y axes) scanner, and coarse sample-to-tip approach mechanism. The microscope is controlled by dedicated electronics and a computer. The system is supported on a vibration isolation system. [5]

  3. Photon scanning microscopy - Wikipedia

    en.wikipedia.org/wiki/Photon_scanning_microscopy

    PSTM can be combined with both electron scanning tunneling microscope and AFM in order to simultaneously record optical, conductive, and topological information of a sample. This experimental apparatus, published by Iwata et al., allows the characterization of semiconductors such as photovoltaics, as well as other photo-conductive materials.

  4. Scanning electrochemical microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_electrochemical...

    The most common scanning mode is constant-height mode, [7] where the tip height is unchanging and is scanned across the surface in the x-y plane. Alternatively, constant distance measurements are possible, which change the z position to maintain the probe to sample distance as the probe is scanned across the surface in the x-y plane.

  5. Scanning tunneling spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling...

    Mechanism of how density of states influence V-A spectra of tunnel junction. Scanning tunneling spectroscopy is an experimental technique which uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and the band gap of surfaces and materials on surfaces at the atomic scale. [1]

  6. Scanning Hall probe microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Hall_probe_microscope

    Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.

  7. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level.

  8. Spin-polarized scanning tunneling microscopy - Wikipedia

    en.wikipedia.org/wiki/Spin-polarized_scanning...

    The spin polarized scanning tunneling microscope is a versatile instrument which has gained tremendous attention due to its enhanced surface sensitivity and lateral resolution up to atomic scale, and can be used as an important tool to study ferromagnetic materials, such as dysprosium (Dy), quasi-2D thin films, nano islands and quasi-1D ...

  9. File:Scanning Tunneling Microscope.ogv - Wikipedia

    en.wikipedia.org/wiki/File:Scanning_Tunneling...

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