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Bridging to VDD or Vss is equivalent to stuck at fault model. Traditionally bridged signals were modeled with logic AND or OR of signals. If one driver dominates the other driver in a bridging situation, the dominant driver forces the logic to the other one, in such case a dominant bridging fault is used.
Fault activation establishes a signal value at the fault model site that is opposite of the value produced by the fault model. Fault propagation moves the resulting signal value, or fault effect, forward by sensitizing a path from the fault site to a primary output. ATPG can fail to find a test for a particular fault in at least two cases.
Basic fault models in digital circuits include: Static faults, which give incorrect values at any speed and sensitized by performing only one operation: the stuck-at fault model. A signal, or gate output, is stuck at a 0 or 1 value, independent of the inputs to the circuit. the bridging fault model. Two signals are connected together when they ...
Various fault types may be applied to the diagnostic model. Commonly used fault types are: stuck-at faults, which simulates a node stuck high or low; stuck-open fault, which simulates a disconnected node; bridging faults, which simulate an unwanted connected between two nodes; transition-delay faults, which simulate slow signal switching on a node
YANG Data Model Incorporated into 802.1Q-2022 802.1Qcy-2019 Virtual Station Interface (VSI) Discovery and Configuration Protocol (VDP) Incorporated into 802.1Q-2022 [10] 802.1Qcr-2020 Bridges and Bridged Networks: Asynchronous Traffic Shaping Incorporated into 802.1Q-2022 [11] 802.1Qcx-2020 YANG Data Model for Connectivity Fault Management
The bulk synchronous parallel (BSP) abstract computer is a bridging model for designing parallel algorithms. It is similar to the parallel random access machine (PRAM) model, but unlike PRAM, BSP does not take communication and synchronization for granted. In fact, quantifying the requisite synchronization and communication is an important part ...
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...