When.com Web Search

Search results

  1. Results From The WOW.Com Content Network
  2. Dielectric spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Dielectric_spectroscopy

    Dielectrics spectroscopy machine. There are a number of different dielectric mechanisms, connected to the way a studied medium reacts to the applied field (see the figure illustration). Each dielectric mechanism is centered around its characteristic frequency, which is the reciprocal of the characteristic time of the process.

  3. Surface plasmon - Wikipedia

    en.wikipedia.org/wiki/Surface_plasmon

    Schematic representation of an electron density wave propagating along a metal–dielectric interface. The charge density oscillations and associated electromagnetic fields are called surface plasmon-polariton waves. The exponential dependence of the electromagnetic field intensity on the distance away from the interface is shown on the right.

  4. Surface plasmon resonance - Wikipedia

    en.wikipedia.org/wiki/Surface_plasmon_resonance

    One of the first common applications of surface plasmon resonance spectroscopy was the measurement of the thickness (and refractive index) of adsorbed self-assembled nanofilms on gold substrates. The resonance curves shift to higher angles as the thickness of the adsorbed film increases. This example is a 'static SPR' measurement.

  5. Maxwell–Wagner–Sillars polarization - Wikipedia

    en.wikipedia.org/wiki/Maxwell–Wagner–Sillars...

    In dielectric spectroscopy, large frequency dependent contributions to the dielectric response, especially at low frequencies, may come from build-ups of charge.This Maxwell–Wagner–Sillars polarization (or often just Maxwell–Wagner polarization), occurs either at inner dielectric boundary layers on a mesoscopic scale, or at the external electrode-sample interface on a macroscopic scale.

  6. Ellipsometry - Wikipedia

    en.wikipedia.org/wiki/Ellipsometry

    Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an ...

  7. Dielectric thermal analysis - Wikipedia

    en.wikipedia.org/wiki/Dielectric_thermal_analysis

    Dielectric thermal analysis (DETA), or dielectric analysis (DEA), is a materials science technique similar to dynamic mechanical analysis except that an oscillating ...

  8. Kramers–Kronig relations - Wikipedia

    en.wikipedia.org/wiki/Kramers–Kronig_relations

    Although electron spectroscopy has poorer energy resolution than light spectroscopy, data on properties in visible, ultraviolet and soft x-ray spectral ranges may be recorded in the same experiment. In angle resolved photoemission spectroscopy the Kramers–Kronig relations can be used to link the real and imaginary parts of the electrons self ...

  9. Dielectric loss - Wikipedia

    en.wikipedia.org/wiki/Dielectric_loss

    The ESR is a derived quantity representing the loss due to both the dielectric's conduction electrons and the bound dipole relaxation phenomena mentioned above. In a dielectric, one of the conduction electrons or the dipole relaxation typically dominates loss in a particular dielectric and manufacturing method. For the case of the conduction ...