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  2. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    Reproduction of an early electron microscope constructed by Ernst Ruska in the 1930s. Many developments laid the groundwork of the electron optics used in microscopes. [2] One significant step was the work of Hertz in 1883 [3] who made a cathode-ray tube with electrostatic and magnetic deflection, demonstrating manipulation of the direction of an electron beam.

  3. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  4. Ernst Ruska - Wikipedia

    en.wikipedia.org/wiki/Ernst_Ruska

    Electron microscope constructed by Ernst Ruska in 1933. Ernst August Friedrich Ruska (German pronunciation: [ɛʁnst ˈʁʊskaː] ⓘ; 25 December 1906 – 27 May 1988) [1] was a German physicist who won the Nobel Prize in Physics in 1986 for his work in electron optics, including the design of the first electron microscope. [2]

  5. Timeline of microscope technology - Wikipedia

    en.wikipedia.org/wiki/Timeline_of_microscope...

    The company of Carl Zeiss exploited this discovery and becomes the dominant microscope manufacturer of its era. 1928: Edward Hutchinson Synge publishes theory underlying the near-field scanning optical microscope; 1931: Max Knoll and Ernst Ruska start to build the first electron microscope. It is a transmission electron microscope (TEM).

  6. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted ...

  7. Aberration-Corrected Transmission Electron Microscopy

    en.wikipedia.org/wiki/Aberration-Corrected...

    Aberration-Corrected Transmission Electron Microscopy (AC-TEM) is the general term for using electron microscopes where electro optical components are introduced to reduce the aberrations that would otherwise reduce the resolution of images. Historically electron microscopes had quite severe aberrations, and until about the start of the 21st ...

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