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In elastic recoil detection analysis, a silicon diode is the most common detector. [1] This type of detector is commonly used, however, there are some major disadvantages when using this type of detector. For example, the energy resolution decreases significantly with a Si detector when detecting heavy recoiled ions.
An optical beam smoke detector is a device that uses a projected beam of light to detect smoke across large areas, [1] typically as an indicator of fire. [2] They are used to detect fires in buildings where standard point smoke detectors would either be uneconomical [ 3 ] or restricted for use by the height of the building.
In those, a quartz monochromator system diffracts the Bremsstrahlung X-rays out of the X-ray beam, which means the sample is only exposed to one narrow band of X-ray energy. For example, if aluminum K-alpha X-rays are used, the intrinsic energy band has a FWHM of 0.43 eV, centered on 1,486.7 eV (E/ΔE = 3,457).
The configuration of the ion beam apparatus can be changed and made more complex with the incorporation of additional components. The techniques for ion beam analysis are designed for specific purposes. Some techniques and ion sources are shown in table 1. Detector types and arrangements for ion beam techniques are shown in table 2.
Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science.Sometimes referred to as high-energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions (typically protons or alpha particles) impinging on a sample.
Typical X-ray detectors for electron microscopes cover only a small solid angle, which makes X-ray detection relatively inefficient since X-rays are emitted from the sample in every direction. However, detectors covering large solid angles have been recently developed, [ 27 ] and atomic resolution X-ray mapping has even been achieved.
For example, they are used in astronomy to analyze the radiation from objects and deduce their chemical composition. The spectrometer uses a prism or a grating to spread the light into a spectrum. This allows astronomers to detect many of the chemical elements by their characteristic spectral lines.
Particle-Induced X-Ray Emission or Proton-Induced X-Ray Emission (PIXE) is a technique used for determining the elemental composition of a material or a sample.When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element.