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An optical beam smoke detector is a device that uses a projected beam of light to detect smoke across large areas, [1] typically as an indicator of fire. [2] They are used to detect fires in buildings where standard point smoke detectors would either be uneconomical [ 3 ] or restricted for use by the height of the building.
In elastic recoil detection analysis, a silicon diode is the most common detector. [1] This type of detector is commonly used, however, there are some major disadvantages when using this type of detector. For example, the energy resolution decreases significantly with a Si detector when detecting heavy recoiled ions.
For example, they are used in astronomy to analyze the radiation from objects and deduce their chemical composition. The spectrometer uses a prism or a grating to spread the light into a spectrum. This allows astronomers to detect many of the chemical elements by their characteristic spectral lines.
Typical X-ray detectors for electron microscopes cover only a small solid angle, which makes X-ray detection relatively inefficient since X-rays are emitted from the sample in every direction. However, detectors covering large solid angles have been recently developed, [ 27 ] and atomic resolution X-ray mapping has even been achieved.
The configuration of the ion beam apparatus can be changed and made more complex with the incorporation of additional components. The techniques for ion beam analysis are designed for specific purposes. Some techniques and ion sources are shown in table 1. Detector types and arrangements for ion beam techniques are shown in table 2.
Historically, such measurements were made using a single detector [1] [2] rotated in an arc about the illuminated sample. The first commercial instrument (formally called a "scattered photometer") was the Brice-Phoenix light scattering photometer introduced in the mid-1950s and followed by the Sofica photometer introduced in the late 1960s.
Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science.Sometimes referred to as high-energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions (typically protons or alpha particles) impinging on a sample.
Within the machine the transducer that detects fluorescence created from the upper beam is located a distance away from the sample and at a 90-degree angle from the incident, upper beam. The machine is constructed like this to decrease the stray light from the upper beam that may strike the detector. The optimal angle is 90 degrees.