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X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
in X-ray imaging, backscattering means just the opposite of transmission imaging; in inelastic neutron or X-ray spectroscopy, backscattering geometry is chosen because it optimizes the energy resolution; in astronomy, backscattered light is that which is reflected with a phase angle of less than 90°.
When light strikes an oil film at an angle, some of the light is reflected from the top surface of the oil, and some is reflected from the bottom surface where it is in contact with the water. Because the light reflecting from the bottom travels a slightly longer path, some light wavelengths are reinforced by this delay, while others tend to be ...
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
The Helmholtz reciprocity principle describes how a ray of light and its reverse ray encounter matched optical adventures, such as reflections, refractions, and absorptions in a passive medium, or at an interface. It does not apply to moving, non-linear, or magnetic media.
Backscatter technology is based on the Compton scattering effect of X-rays, a form of ionizing radiation.Unlike a traditional X-ray machine, which relies on the transmission of X-rays through the object, backscatter X-ray detects the radiation that reflects from the object and forms an image.
Bragg diffraction (also referred to as the Bragg formulation of X-ray diffraction) was first proposed by Lawrence Bragg and his father, William Henry Bragg, in 1913 [1] after their discovery that crystalline solids produced surprising patterns of reflected X-rays (in contrast to those produced with, for instance, a liquid).
Geometry of a GISAS experiment. The incident beam strikes the sample under a small angle close to the critical angle of total external x-ray reflection. The intense reflected beam as well as the intense scattering in the incident plane are attenuated by a rod-shaped beam stop.