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DFT affects and depends on the methods used for test development, test application, and diagnostics. Most tool-supported DFT practiced in the industry today, at least for digital circuits, is predicated on a Structural test paradigm. Structural test makes no direct attempt to determine if the overall functionality of the circuit is correct.
Test compression is a technique used to reduce the time and cost of testing integrated circuits.The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design.
Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.
A fault coverage test passes when at least a specified percentage of all possible faults can be detected. If it does not pass, at least three options are possible. First, the designer can augment or otherwise improve the vector set, perhaps by using a more effective automatic test pattern generation tool. Second, the circuit may be re-defined ...
The DFT has seen wide usage across a large number of fields; we only sketch a few examples below (see also the references at the end). All applications of the DFT depend crucially on the availability of a fast algorithm to compute discrete Fourier transforms and their inverses, a fast Fourier transform.
The design guidelines usually propose an approach and corresponding methods that may help to generate and apply technical knowledge to control, improve, or even invent particular traits of a product. From a knowledge-based view, the design guideline represents an explicit form of knowledge, that contains information about knowing-how-to (see ...
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