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Capacitance is proportional to the area of overlap and inversely proportional to the separation between conducting sheets. The closer the sheets are to each other, the greater the capacitance. An example is the capacitance of a capacitor constructed of two parallel plates both of area separated by a distance .
The capacitance increases with the area A of the plates and with the permittivity ε of the dielectric material, and decreases with the plate separation distance d. The capacitance is therefore greatest in devices made from materials with a high permittivity, large plate area, and small distance between plates.
The capacitance of certain capacitors decreases as the component ages. In ceramic capacitors, this is caused by degradation of the dielectric. The type of dielectric, ambient operating and storage temperatures are the most significant aging factors, while the operating voltage usually has a smaller effect, i.e., usual capacitor design is to ...
The relative static permittivity, ε r, can be measured for static electric fields as follows: first the capacitance of a test capacitor, C 0, is measured with vacuum between its plates. Then, using the same capacitor and distance between its plates, the capacitance C with a dielectric between the plates is measured. The relative permittivity ...
Because of the sheet resistance of the surface, each corner is measured to have a different effective capacitance. The sensor's controller can determine the location of the touch indirectly from the change in the capacitance as measured from the four corners of the panel: the larger the change in capacitance, the closer the touch is to that corner.
The permissible changes of capacitance, dissipation factor and insulation resistance vary with the film material, and are specified in the relevant data sheet. Variations over the course of time which exceed the specified values are considered as a degradation failure.
Capacitance–voltage profiling (or C–V profiling, sometimes CV profiling) is a technique for characterizing semiconductor materials and devices. The applied voltage is varied, and the capacitance is measured and plotted as a function of voltage.
The capacitance value specified in manufacturers' data sheets is called the rated capacitance C R or nominal capacitance C N and is the value for which the capacitor has been designed. Standardized measuring conditions for electrolytic capacitors are an AC measurement with 0.5 V [ clarification needed ] at a frequency of 100/120 Hz and a ...