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A charged device model (CDM) test is used to define the ESD a device can withstand when the device itself has an electrostatic charge and discharges due to metal contact. This discharge type is the most common type of ESD in electronic devices and causes most of the ESD damages in their manufacturing.
Electrostatic discharge (ESD) is a subclass of electrical overstress and may cause immediate device failure, permanent parameter shifts and latent damage causing increased degradation rate. It has at least one of three components, localized heat generation, high current density and high electric field gradient; prolonged presence of currents of ...
Electrostatic discharge: An ESD may cause immediate failure of the semiconductor junction, a permanent shift of its parameters, or latent damage causing increased rate of degradation. LEDs and lasers grown on sapphire substrate (see silicon on sapphire) are more susceptible to ESD damage.
Symbol for an ESD protection device – EPA Alternate warning symbol Symbol of an ESD grounding point for all components. An electrostatic-sensitive device (often abbreviated ESD) is any component (primarily electrical) which can be damaged by common static charges which build up on people, tools, and other non-conductors or semiconductors. [1]
ESD is treated as a small, localized phenomenon, although technically a lightning flash is a very large ESD event. ESD can also be man-made, as in the shock received from a Van de Graaff generator. An ESD event can damage electronic circuitry by injecting a high-voltage pulse, besides giving people an unpleasant shock.
Warning label for an electrostatic sensitive device, denoting the devices susceptibility to damage. A similar symbol without the bar and with a black "dome" denotes ESD-safe equipment. The human-body model (HBM) is the most commonly used model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge ...
Another common cause of latch-ups is ionizing radiation which makes this a significant issue in electronic products designed for space (or very high-altitude) applications. A single event latch-up is a latch-up caused by a single event upset , typically heavy ions or protons from cosmic rays or solar flares.
An antistatic device is any device that reduces, dampens, or otherwise inhibits electrostatic discharge, or ESD, which is the buildup or discharge of static electricity. [1] [2] ESD can damage electrical components such as computer hard drives, and even ignite flammable liquids and gases.