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  2. Crystallographic defect - Wikipedia

    en.wikipedia.org/wiki/Crystallographic_defect

    An example is the Stone Wales defect in nanotubes, which consists of two adjacent 5-membered and two 7-membered atom rings. Schematic illustration of defects in a compound solid, using GaAs as an example. Amorphous solids may contain defects. These are naturally somewhat hard to define, but sometimes their nature can be quite easily understood.

  3. Crystal twinning - Wikipedia

    en.wikipedia.org/wiki/Crystal_twinning

    For example, the twin operation may be reflection across a plane that is not a symmetry plane of the single crystal. [ 1 ] [ 2 ] On the microscopic level, the twin boundary is characterized by a set of atomic positions in the crystal lattice that are shared between the two orientations.

  4. Anti-phase domain - Wikipedia

    en.wikipedia.org/wiki/Anti-phase_domain

    (Similar defects form in GaN on silicon, where they are correctly identified as inversion domains). An example is illustrated in the diagram below. [3] Figure 4. Highlighted area showing an inversion domain, incorrectly called an antiphase domain, in GaAs on Si. [4] The shaded region, B, is an example of an APD.

  5. Trefftz method - Wikipedia

    en.wikipedia.org/wiki/Trefftz_method

    The hybrid Trefftz finite-element method has been considerably advanced since its introduction by J. Jiroušek in the late 1970s. [1] The conventional method of finite element analysis involves converting the differential equation that governs the problem into a variational functional from which element nodal properties – known as field variables – can be found.

  6. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    An electron backscatter diffraction pattern of monocrystalline silicon, taken at 20 kV with a field-emission electron source. Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials.

  7. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]

  8. MacCormack method - Wikipedia

    en.wikipedia.org/wiki/MacCormack_method

    In computational fluid dynamics, the MacCormack method (/məˈkɔːrmæk ˈmɛθəd/) is a widely used discretization scheme for the numerical solution of hyperbolic partial differential equations. This second-order finite difference method was introduced by Robert W. MacCormack in 1969. [ 1 ]

  9. Material point method - Wikipedia

    en.wikipedia.org/wiki/Material_Point_Method

    Spurious oscillation may occur as particles cross the boundaries of the mesh in MPM, although this effect can be minimized by using generalized interpolation methods (GIMP). In MPM as in FEM, the size and orientation of the mesh can impact the results of a calculation: for example, in MPM, strain localisation is known to be particularly ...