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  2. Transmission Electron Aberration-corrected Microscope Project

    en.wikipedia.org/wiki/Transmission_Electron...

    The TEAM is based on a commercial FEI Titan 80–300 electron microscope, which can be operated at voltages between 80 and 300 keV, both in TEM and scanning transmission electron microscopy (STEM) modes. To minimize the mechanical vibrations, the microscope is located in a separate room within a sound-proof enclosure and is operated remotely.

  3. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.

  4. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  5. 4D scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/4D_scanning_transmission...

    Phase orientation mapping is typically done with electron back scattered diffraction in SEM which can give 2D maps of grain orientation in polycrystalline materials. [34] The technique can also be done in TEM using Kikuchi lines, which is more applicable for thicker samples since formation of Kikuchi lines relies on diffuse scattering being ...

  6. Annular dark-field imaging - Wikipedia

    en.wikipedia.org/wiki/Annular_dark-field_imaging

    Conventional TEM dark-field imaging uses an objective aperture to only collect scattered electrons that pass through. In contrast, STEM dark-field imaging does not use an aperture to differentiate the scattered electrons from the main beam, but uses an annular detector to collect only the scattered electrons. [ 2 ]

  7. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen.

  8. Transmission electron cryomicroscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron_cryo...

    CryoTEM image of GroEL suspended in amorphous ice at 50 000 × magnification Structure of Alcohol oxidase from Pichia pastoris by CryoTEM. Transmission electron cryomicroscopy (CryoTEM), commonly known as cryo-EM, is a form of cryogenic electron microscopy, more specifically a type of transmission electron microscopy (TEM) where the sample is studied at cryogenic temperatures (generally liquid ...

  9. Aberration-corrected transmission electron microscopy

    en.wikipedia.org/wiki/Aberration-Corrected...

    The design parameters and functional requirements for phase plates were thoroughly examined in the context of their application as spherical aberration correctors. In particular, emphasis was placed on developing a programmable, electrostatic phase plate, highlighting its potential for precise control and adaptability in correcting aberrations.