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A charged device model (CDM) test is used to define the ESD a device can withstand when the device itself has an electrostatic charge and discharges due to metal contact. This discharge type is the most common type of ESD in electronic devices and causes most of the ESD damages in their manufacturing.
The notion of a symbol for an ESD protection device came about in response to the increased usage and failures of static sensitive components by then the computer systems manufacturer, Sperry Univac. Field repairs to and handling of ESD printed circuit boards (PCBs) were resulting in extremely high failure rates. Studies of PCB failures ...
Electrostatic discharge (ESD) is a subclass of electrical overstress and may cause immediate device failure, permanent parameter shifts and latent damage causing increased degradation rate. It has at least one of three components, localized heat generation, high current density and high electric field gradient; prolonged presence of currents of ...
ESD events are characterized by high voltages of many kV, but small currents sometimes cause visible sparks. ESD is treated as a small, localized phenomenon, although technically a lightning flash is a very large ESD event. ESD can also be man-made, as in the shock received from a Van de Graaff generator.
An antistatic device is any device that reduces, dampens, or otherwise inhibits electrostatic discharge, or ESD, which is the buildup or discharge of static electricity. [ 1 ] [ 2 ] ESD can damage electrical components such as computer hard drives, and even ignite flammable liquids and gases.
Conductive ESD bag with a network card inside ESD shoes. Electrostatic discharge materials (ESD materials) are plastics that reduce static electricity to protect against damage to electrostatic-sensitive devices (ESD) or to prevent the accidental ignition of flammable liquids or gases.
In electronics, a latch-up is a type of short circuit which can occur in an integrated circuit (IC). More specifically, it is the inadvertent creation of a low-impedance path between the power supply rails of a MOSFET circuit, triggering a parasitic structure which disrupts proper functioning of the part, possibly even leading to its destruction due to overcurrent.
ESD (gene), a human gene/enzyme; Electrostatic discharge, a sudden flow of electricity between two electrically charged objects; Electrostatic-sensitive device, any component which can be damaged by common static charges; Energy spectral density, a part of a function in statistical signal processing