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Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
The addition of auto-alignment systems reduced the setup time needed to image multiple ICs, and by the late 1980s, the stepper had almost entirely replaced the aligner in the high-end market. The stepper was itself replaced by the step-and-scan systems (scanners) which offered an additional order of magnitude resolution advance. Step-and-scan ...
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties.
KLA Corporation is an American company based in Milpitas, California that makes wafer fab equipment.It supplies process control and yield management systems for the semiconductor industry and other related nanoelectronics industries.
Mochii is a miniature scanning electron microscope made by Seattle-based startup company Voxa. The Mochii has the same capabilities as a conventional SEM, such as usage in materials science for research purposes, microchip and semiconductor quality control, and medicine. [2] Mochii users are able to operate the microscope using an IOS app.
The name Scanning Capacitance Microscopy was first used to describe a quality control tool for the RCA/CED (Capacitance Electronic Disc), [1] a video disk technology that was a predecessor of the DVD. It has since been adapted for use in combination with scanned probe microscopes for measuring other systems and materials with semiconductor ...
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