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Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties.
The addition of auto-alignment systems reduced the setup time needed to image multiple ICs, and by the late 1980s, the stepper had almost entirely replaced the aligner in the high-end market. The stepper was itself replaced by the step-and-scan systems (scanners) which offered an additional order of magnitude resolution advance. Step-and-scan ...
One of the first, on the Model 110, was the addition of an automated wafer loader, which allowed the operators to rapidly mask many wafers in a row. The Model 111 was a single-wafer model that replaced the 100, and could be adapted for use with 2-, 2.5- or 3-inch wafers, and optionally 4×4-, 3.5×3.5- or 3×3-inch masks.
Mochii is a miniature scanning electron microscope made by Seattle-based startup company Voxa. The Mochii has the same capabilities as a conventional SEM, such as usage in materials science for research purposes, microchip and semiconductor quality control, and medicine. [2] Mochii users are able to operate the microscope using an IOS app.
Tennelec also manufactured innovative scanning radios in the 1970s. The first programmable radio scanner was the Memoryscan from Tennelec Commercial Products Division, introduced in 1974, and later known as the Memoryscan 1 (model MS-1). [1] [2] This was followed by a slightly improved model, the Memoryscan 2 (model MS-2). Prior to the MS-1 and ...