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Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales. Some common examples of microscopy techniques include: Optical ...
Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.
Nevertheless, powder X-ray diffraction is a powerful and useful technique in its own right. It is mostly used to characterize and identify phases, and to refine details of an already known structure, rather than solving unknown structures. Advantages of the technique are: simplicity of sample preparation; rapidity of measurement
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
Usually X-ray diffraction in spectrometers is achieved on crystals, but in Grating spectrometers, the X-rays emerging from a sample must pass a source-defining slit, then optical elements (mirrors and/or gratings) disperse them by diffraction according to their wavelength and, finally, a detector is placed at their focal points.
TGA – Thermogravimetric analysis; TIKA – Transmitting ion kinetic analysis; TIMS – Thermal ionization mass spectrometry; TIRFM – Total internal reflection fluorescence microscopy; TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy; TMA – Thermomechanical analysis; TOF-MS – Time-of-flight mass spectrometry
Energy-dispersive X-ray diffraction (EDXRD) is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle. [1] With no need for a goniometer, EDXRD is able to collect full diffraction patterns very quickly.
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