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  2. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    Crystal structure can also be investigated by high-resolution transmission electron microscopy (HRTEM), also known as phase contrast. When using a field emission source and a specimen of uniform thickness, the images are formed due to differences in phase of electron waves, which is caused by specimen interaction. [41]

  3. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...

  4. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    The resolution of TEMs is limited primarily by spherical aberration, but a new generation of hardware correctors can reduce spherical aberration to increase the resolution in high-resolution transmission electron microscopy (HRTEM) to below 0.5 angstrom (50 picometres), [32] enabling magnifications above 50 million times. [33]

  5. Contrast transfer function - Wikipedia

    en.wikipedia.org/wiki/Contrast_transfer_function

    Above the sample, the electron wave can be approximated as a plane wave. As the electron wave, or wavefunction, passes through the sample, both the phase and the amplitude of the electron beam is altered. The resultant scattered and transmitted electron beam is then focused by an objective lens, and imaged by a detector in the image plane.

  6. Aberration-Corrected Transmission Electron Microscopy

    en.wikipedia.org/wiki/Aberration-Corrected...

    Scherzer's theorem is a theorem in the field of electron microscopy. It states that there is a limit of resolution for electronic lenses because of unavoidable aberrations. German physicist Otto Scherzer found in 1936 [1] that the electromagnetic lenses, which are used in electron microscopes to focus the electron beam, entail unavoidable ...

  7. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    High-resolution scanning transmission electron microscopes require exceptionally stable room environments. In order to obtain atomic resolution images in STEM, the level of vibration, temperature fluctuations, electromagnetic waves, and acoustic waves must be limited in the room housing the microscope. [1]

  8. Transmission electron microscopy DNA sequencing - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    The electron microscope can achieve a resolution of up to 100 picometers, allowing eukaryotic cells, prokaryotic cells, viruses, ribosomes, and even single atoms to be visualized (note the logarithmic scale). Transmission electron microscopy DNA sequencing is a single-molecule sequencing technology that uses transmission electron microscopy ...

  9. Annular dark-field imaging - Wikipedia

    en.wikipedia.org/wiki/Annular_dark-field_imaging

    Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. [1] Conventional TEM dark-field imaging uses an objective aperture to only collect scattered electrons that pass through.