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  2. Huawei P40 - Wikipedia

    en.wikipedia.org/wiki/Huawei_P40

    The P40 can charge wired up to 22.5 W while the P40 Pro and P40 Pro+ have a max rate of 40 W. Both the P40 Pro and P40 Pro+ are also capable of reverse wireless charging at 27 W, but the P40 Pro+ can charge faster wirelessly at 40 W whereas the P40 Pro can only charge wirelessly at 27 W.

  3. List of longest smartphone telephoto lenses - Wikipedia

    en.wikipedia.org/wiki/List_of_longest_smartphone...

    For example, the Vivo X90 Pro+'s 90mm lens still has a 60% larger effective sensor area when digitally cropped to match the field of view of the X80 Pro's 125mm lens. [ a ] As such, the following list excludes lenses using sensors smaller than 1/3.5″, which seems to be a lower bound for acceptable image quality (for comparison, most compact ...

  4. Test point - Wikipedia

    en.wikipedia.org/wiki/Test_point

    The two rows of holes (labelled #3) are test points used during the manufacture of this USB memory key. Testpoints on a printed circuit board (labelled E34, E35, E36, …) next to teardrop vias. A test point is a location within an electronic circuit that is used to monitor the state of the circuitry or inject test signals. [1]

  5. Huawei Mate 40 - Wikipedia

    en.wikipedia.org/wiki/Huawei_Mate_40

    On the Mate 40 Pro and Mate 40 Pro+, the screen is dramatically curved like the Mate 30 Pro, but has physical volume buttons. Unlike the P40 series, the Mate 40 series uses a traditional earpiece speaker instead of an "electromagnetic levitation" speaker that vibrates the top of the phone's screen; the top edge has an IR blaster.

  6. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  7. Bead probe technology - Wikipedia

    en.wikipedia.org/wiki/Bead_probe_technology

    Bead probe technology is a probing method used to connect electronic test equipment to the device under test (DUT) within a bed of nails fixture. The technique was first used in the 1990s [ 3 ] and originally given the name “Waygood Bump” after one of the main proponents, Rex Waygood.

  8. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.

  9. Huawei Mate 60 - Wikipedia

    en.wikipedia.org/wiki/Huawei_Mate_60

    The Huawei Mate 60 (stylized as HUAWEI Mate60) is a series of high-end 2023 smartphone product by the Chinese Huawei corporation from its Huawei Mate series. [3] It has a Kirin 9000s SoC chipset designed by HiSilicon and produced by the SMIC foundry. [4]