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XPS physics - the photoelectric effect.. Because the energy of an X-ray with particular wavelength is known (for Al K α X-rays, E photon = 1486.7 eV), and because the emitted electrons' kinetic energies are measured, the electron binding energy of each of the emitted electrons can be determined by using the photoelectric effect equation,
Electron spectroscopy refers to a group formed by techniques based on the analysis of the energies of emitted electrons such as photoelectrons and Auger electrons.This group includes X-ray photoelectron spectroscopy (XPS), which also known as Electron Spectroscopy for Chemical Analysis (ESCA), Electron energy loss spectroscopy (EELS), Ultraviolet photoelectron spectroscopy (UPS), and Auger ...
Extreme-ultraviolet photoelectron spectroscopy (EUPS) lies in between XPS and UPS. It is typically used to assess the valence band structure. [8] Compared to XPS, it gives better energy resolution, and compared to UPS, the ejected electrons are faster, resulting in less space charge and mitigated final state effects. [9] [10] [11]
In a more formal definition, the L shell is initially fully occupied. In this case, the lighter species with K-alpha is neon. [5] This choice also places K-alpha firmly in the X-ray energy range. Similarly to Lyman-alpha, the K-alpha emission is composed of two spectral lines, K-alpha 1 (Kα 1) and K-alpha 2 (Kα 2). [6]
XPS may refer to: X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA) Extreme Ultraviolet Photometer System (XPS). an instrument aboard the NASA Solar Radiation and Climate Experiment (SORCE) space probe
The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects [1] such as paintings.
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
The XANES energy region [3] extends between the edge region and the EXAFS region over a 50-100 eV energy range around the core level x-ray absorption threshold. Before 1980 the XANES region was wrongly assigned to different final states: a) unoccupied total density of states, or b) unoccupied molecular orbitals (kossel structure) or c) unoccupied atomic orbitals or d) low energy EXAFS ...