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An optical profilometer is a non-contact method for providing much of the same information as a stylus based profilometer. There are many different techniques which are currently being employed, such as laser triangulation ( triangulation sensor ), confocal microscopy (used for profiling very small objects), coherence scanning interferometry ...
The next-generation UMT now also incorporates a reliable optical profiler from Bruker that can rapidly and accurately measure surfaces before and after tribology or mechanical testing. Profile ...
HommelMap on Jenoptik's profilometers (Hommel-Etamic line of products), MountainsMap - X on Nikon's microscopes, Apex 2D or Apex 3D on KLA-Tencor's profilometers, Leica Map on Leica's microscopes, [6] ConfoMap on Carl Zeiss' microscopes, [7] MCubeMap on Mitutoyo profilometers. [8] Vision 64 Map on Bruker optical profilometers [9]
Bruker Corporation is an American manufacturer of scientific instruments for molecular and materials research, as well as for industrial and applied analysis. It is headquartered in Billerica, Massachusetts, and is the publicly traded parent company of Bruker Scientific Instruments (Bruker AXS, Bruker BioSpin, Bruker Daltonics and Bruker Optics) and Bruker Energy & Supercon Technologies (BEST ...
The instrument is the latest addition to Bruker's ContourGT® line of 3D optical microscopes. These systems feature patented, higher brightness dual-LED illumination that, when combined with their ...
Bruker Introduces New Value Standard with Scalable Microscope for Combined Optical Surface Metrology and Imaging New ContourGT-K Delivers Uncompromised Bench-Top 3D Optical Microscopy Performance ...
Figure 2: Optical setup of a Twyman-Green interferometer with a CCD image sensor. The interference occurs for white light when the path lengths of the measurement beam and the reference beam are nearly matched. By scanning (changing) the measurement beam path length relative to the reference beam, a correlogram is generated at each pixel. The ...
Another disadvantage is that profilometers have difficulty detecting flaws of the same general size as the roughness of the surface. [1] There are also limitations for non-contact instruments. For example, instruments that rely on optical interference cannot resolve features that are less than some fraction of the operating wavelength.