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Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
The Zwick Roell Group is a manufacturer of static testing machines and systems for materials and components testing used to evaluate the mechanical and physical properties and performance of materials and components.
The company operates in two divisions: Test and Sensors. In December 2020, Amphenol Corporation announced it had reached an agreement to acquire MTS in an acquisition completed on April 7, 2021. [2] [3] In January 2021, ITW announced it had in turn reached an agreement to acquire the test and simulation business of MTS from Amphenol in the ...
Tensile testing, also known as tension testing, [1] is a fundamental materials science and engineering test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength , breaking strength , maximum elongation and reduction in area. [ 2 ]
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
Tinius Olsen (December 7, 1845 – October 20, 1932) was a Norwegian-born American engineer and inventor.He was the founder of the Tinius Olsen Material Testing Machine Company, a maker of material testing machines.
A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...
Accelerated life testing is the process of testing a product by subjecting it to conditions (stress, strain, temperatures, voltage, vibration rate, pressure etc.) in excess of its normal service parameters in an effort to uncover faults and potential modes of failure in a short amount of time.