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  2. Universal testing machine - Wikipedia

    en.wikipedia.org/wiki/Universal_testing_machine

    Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...

  3. Zwick Roell Group - Wikipedia

    en.wikipedia.org/wiki/Zwick_Roell_Group

    The Zwick Roell Group is a manufacturer of static testing machines and systems for materials and components testing used to evaluate the mechanical and physical properties and performance of materials and components.

  4. MTS Systems Corporation - Wikipedia

    en.wikipedia.org/wiki/MTS_Systems_Corporation

    The company operates in two divisions: Test and Sensors. In December 2020, Amphenol Corporation announced it had reached an agreement to acquire MTS in an acquisition completed on April 7, 2021. [2] [3] In January 2021, ITW announced it had in turn reached an agreement to acquire the test and simulation business of MTS from Amphenol in the ...

  5. Tensile testing - Wikipedia

    en.wikipedia.org/wiki/Tensile_testing

    A universal testing machine (Hegewald & Peschke) The most common testing machine used in tensile testing is the universal testing machine. This type of machine has two crossheads; one is adjusted for the length of the specimen and the other is driven to apply tension to the test specimen. Testing machines are either electromechanical or ...

  6. Category:Standardised tests in Pakistan - Wikipedia

    en.wikipedia.org/wiki/Category:Standardised...

    Inter Services Selection Board (Pakistan) N. National Medical and Dental College Admission Test; National Testing Service This page was last ...

  7. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...

  8. Universal Test Specification Language - Wikipedia

    en.wikipedia.org/wiki/Universal_Test...

    Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.

  9. Siemens Pakistan - Wikipedia

    en.wikipedia.org/wiki/Siemens_Pakistan

    Siemens (Pakistan) Engineering Company Limited is a Pakistani engineering services company headquartered in Karachi. [3] It is a subsidiary of Siemens AG.. Active since 1953, Siemens Pakistan is one of the largest providers of engineering services and management in the country, with overseeing ongoing projects in healthcare, defence development, energy, [4] telecommunications, computer ...