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  2. Three-dimensional X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Three-dimensional_X-ray...

    Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.

  3. Characterization (materials science) - Wikipedia

    en.wikipedia.org/wiki/Characterization...

    The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...

  4. X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_spectroscopy

    Usually X-ray diffraction in spectrometers is achieved on crystals, but in Grating spectrometers, the X-rays emerging from a sample must pass a source-defining slit, then optical elements (mirrors and/or gratings) disperse them by diffraction according to their wavelength and, finally, a detector is placed at their focal points.

  5. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    The use of computational methods for the powder X-ray diffraction data analysis is now generalized. It typically compares the experimental data to the simulated diffractogram of a model structure, taking into account the instrumental parameters, and refines the structural or microstructural parameters of the model using least squares based ...

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...

  7. Polymer characterization - Wikipedia

    en.wikipedia.org/wiki/Polymer_characterization

    Many of the analytical techniques used to determine the molecular structure of unknown organic compounds are also used in polymer characterization. Spectroscopic techniques such as ultraviolet-visible spectroscopy, infrared spectroscopy, Raman spectroscopy, nuclear magnetic resonance spectroscopy, electron spin resonance spectroscopy, X-ray ...

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