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  2. Electromigration - Wikipedia

    en.wikipedia.org/wiki/Electromigration

    The first observation of electromigration in thin films was made by I. Blech. [2] Research in this field was pioneered by a number of investigators throughout the fledgling semiconductor industry. One of the most important engineering studies was performed by Jim Black of Motorola, after whom Black's equation is named. [3]

  3. Electrophoretic mobility shift assay - Wikipedia

    en.wikipedia.org/wiki/Electrophoretic_mobility...

    The use of different oligonucleotides of defined sequence allows the identification of the precise binding site by competition (not shown in diagram). Variants of the competition assay are useful for measuring the specificity of binding and for measurement of association and dissociation kinetics.

  4. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    Diffusion and electromigration tend to be accelerated by high temperatures, shortening the lifetime of the device; damage to junctions not leading to immediate failure may manifest as altered current–voltage characteristics of the junctions. Electrical overstress failures can be classified as thermally-induced, electromigration-related and ...

  5. Nernst–Planck equation - Wikipedia

    en.wikipedia.org/wiki/Nernst–Planck_equation

    The Nernst–Planck equation is a conservation of mass equation used to describe the motion of a charged chemical species in a fluid medium. It extends Fick's law of diffusion for the case where the diffusing particles are also moved with respect to the fluid by electrostatic forces.

  6. Black's equation - Wikipedia

    en.wikipedia.org/wiki/Black's_equation

    Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field. The equation is: [1] = ()

  7. Feedback-controlled electromigration - Wikipedia

    en.wikipedia.org/wiki/Feedback-controlled...

    Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration .

  8. Electrochemical migration - Wikipedia

    en.wikipedia.org/wiki/Electrochemical_migration

    Electrochemical migration (ECM) is the dissolution and movement of metal ions in presence of electric potential, which results in the growth of dendritic structures between anode and cathode.

  9. Length constant - Wikipedia

    en.wikipedia.org/wiki/Length_constant

    This means that the length constant is the distance at which 63% of V max has been reached during the rise of voltage. Setting for x = λ for the fall of voltage sets V(x) equal to .37 V max, meaning that the length constant is the distance at which 37% of V max has been reached during the fall of voltage.