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Though discovered in 1927, low-energy electron diffraction did not become a popular tool for surface analysis until the early 1960s. The main reasons were that monitoring directions and intensities of diffracted beams was a difficult experimental process due to inadequate vacuum techniques and slow detection methods such as a Faraday cup.
Close to an aperture or atoms, often called the "sample", the electron wave would be described in terms of near field or Fresnel diffraction. [12]: Chpt 7-8 This has relevance for imaging within electron microscopes, [1]: Chpt 3 [2]: Chpt 3-4 whereas electron diffraction patterns are measured far from the sample, which is described as far-field or Fraunhofer diffraction. [12]:
Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects. In 2020, the ICDD and the Cambridge Crystallographic Data Centre, which curates and maintains the Cambridge Structural Database, announced a data partnership.
Kikuchi lines in a convergent beam diffraction pattern of single crystal silicon taken with a 300 keV electron beam. The figure on the left shows the Kikuchi lines leading to a silicon [100] zone, taken with the beam direction approximately 7.9° away from the zone along the (004) Kikuchi band.
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It was adopted by the International Union of Crystallography , who also provides full specifications of the format. [2] It is supported by all major crystallographic databases. The increasing automation of the crystal structure determination process has resulted in ever higher publishing rates of new crystal structures and, consequentially, new ...