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A coordinate-measuring machine (CMM) is a device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe. Various types of probes are used in CMMs, the most common being mechanical and laser sensors, though optical and white light sensors do exist.
A coordinate measuring machine (CMM) with scanning head. Contact 3D scanners work by physically probing (touching) the part and recording the position of the sensor as the probe moves around the part. There are two main types of contact 3D scanners:
Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor industry. The characterization of individual devices is instrumental to engineers and integrated circuit designers during initial product development and debug.
A CMM provides a rapid method for inspecting absolute points, but geometric relationships, such as runout, parallelism, perpendicularity, etc., must be calculated rather than measured directly. By aligning an accurate spindle with an electronic test indicator with a geometric feature of interest, rather than using a non-scanning cartesian probe ...
VIEW Engineering's Logo, circa 1976 VIEW Engineering's Logo, circa 1996. While working as a physicist at Hughes Aircraft Company, Dick Hubach recognized a need for automated dimensional measurement systems, when he discovered that the cost to verify the correct manufacture of some aerospace components actually exceeded the cost to manufacture those components. [3]
Non-binary people have been around since at least 400 B.C. to 200 A.D., according to Healthline, when “Hijras (people in India who identified as beyond male or female) were referenced in ancient ...
Side view of a PCB showing a solder bead and test probe. Bead probe technology is a probing method used to connect electronic test equipment to the device under test (DUT) within a bed of nails fixture. The technique was first used in the 1990s [3] and originally given the name “Waygood Bump” after one of the main proponents, Rex Waygood.
(c) Probing with sharp tips can be non-invasive (high ohmic), while lithographic contacts are typically invasive (low ohmic). [1] To use a scanning tunneling microscope (STM) for electrical transport measurements at nanostructures or at surfaces, more than one tip is required.