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A coordinate-measuring machine (CMM) is a device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe. Various types of probes are used in CMMs, the most common being mechanical and laser sensors, though optical and white light sensors do exist.
A CMM is based on CNC technology to automate measurement of Cartesian coordinates using a touch probe, contact scanning probe, or non-contact sensor. Optical comparators are used when physically touching the part is undesirable; components that consist of fragile or mailable materials require measurement using non-contact techniques.
The development of precision probes dates back to the 1920s with different mechanical touch devices, but significant advancements came with the advent of Coordinate Measuring Machines (CMM) in the late 1950s. This led to the creation of contact and non-contact probes, including mechanical triggers and scanning probes, as well as laser and ...
A CMM provides a rapid method for inspecting absolute points, but geometric relationships, such as runout, parallelism, perpendicularity, etc., must be calculated rather than measured directly. By aligning an accurate spindle with an electronic test indicator with a geometric feature of interest, rather than using a non-scanning cartesian probe ...
A white light scanner (WLS) is a device for performing surface height measurements of an object using coherence scanning interferometry with spectrally-broadband, "white light" illumination. Different configurations of scanning interferometer may be used to measure macroscopic objects with surface profiles measuring in the centimeter range, to ...
Structured light scanners use projected light patterns and digital cameras to analyse the geometry of an object. [5] As with laser scanning, objects with high reflectivity and translucence can cause problems but temporary coatings can be applied to prevent this.
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height in order to map the work function of the surface. A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller.