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The HP4145A semiconductor parameter analyzer introduced in 1982 was capable of a complete DC characterization of semiconductor devices and materials. [2] It consisted of four independently controlled source monitor units (the precursor to source measure units) enclosed in a mainframe.
List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE. The following table is split into two groups based on whether it has a graphical visual interface or not.
MFEM is a free, lightweight, scalable C++ library for finite element methods that features arbitrary high-order finite element meshes and spaces, support for a wide variety of discretizations, and emphasis on usability, generality, and high-performance computing efficiency.
A multitude of semiconductor device and material parameters can be derived from C–V measurements with appropriate methodologies, instrumentation, and software. This information is used throughout the semiconductor production chain, and begins with evaluating epitaxially grown crystals, including parameters such as average doping concentration ...
Agilent Technologies was created in 1999 as a spin-off of several business units of Hewlett-Packard [12] including test & measurement, optics, instrumentation and chemical analysis, electronic components, and medical equipment product lines.
Liberty Analyzer - Analysis and validation of timing, power, noise and area data from characterization; TCAD. Victory Process - 2D/3D semiconductor process simulator; Victory Device - 2D/3D semiconductor device simulator; Virtual Wafer Fab - Emulation of wafer manufacturing to perform design-of-experiments and optimization.
Download System Mechanic to help repair and speed up your slow PC. Try it free* for 30 days now. ... cancel before the 30-day trial ends. ... Clearing out unnecessary files and programs can free ...
Technology files and design rules are essential building blocks of the integrated circuit design process. Their accuracy and robustness over process technology, its variability and the operating conditions of the IC—environmental, parasitic interactions and testing, including adverse conditions such as electro-static discharge—are critical in determining performance, yield and reliability.