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A semiconductor detector in ionizing radiation detection physics is a device that uses a semiconductor (usually silicon or germanium) to measure the effect of incident charged particles or photons. Semiconductor detectors find broad application for radiation protection , gamma and X-ray spectrometry , and as particle detectors .
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In nuclear electronics, a microstrip detector is a particle detector that consists of a large number of identical semiconductor strips laid out along one axis of a two-dimensional structure, generally by lithography. The geometrical layout of the components allows to accurately reconstruct the track of an incoming particle of ionizing radiation.
A readout integrated circuit (ROIC) is an integrated circuit (IC) specifically used for reading detectors of a particular type. They are compatible with different types of detectors such as infrared and ultraviolet.
Semiconductor detectors in which one of more constituent atoms are neutron reactive are called bulk semiconductor neutron detectors. Bulk solid-state neutron detectors can be divided into two basic categories: those that rely on the detection of charged-particle reaction products and those that rely on the detection of prompt capture gamma rays.
There are a wide variety of photodetectors which may be classified by mechanism of detection, such as photoelectric or photochemical effects, or by various performance metrics, such as spectral response. Semiconductor-based photodetectors typically use a p–n junction that converts photons into charge. The absorbed photons make electron–hole ...
Schematic of a solid-state detector. The operating principle of Semiconductor detectors is similar to gas ionization detectors: except that instead of ionization of gas atoms, free electrons and holes are produced which create a signal at the electrodes. The advantage of solid state detectors is the greater resolution of the resultant energy ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.