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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Title of the Boeing T-43A Flight Manual. An aircraft flight manual (AFM) is a paper book or electronic information set containing information required to operate an aircraft of certain type or particular aircraft of that type (each AFM is tailored for a specific aircraft, though aircraft of the same type naturally have very similar AFMs).
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Bimodal AFM is applied to characterize a large variety of surfaces and interfaces. Some applications exploit the sensitivity of bimodal observables to enhance spatial resolution. However, the full capabilities of bimodal AFM are shown in the generation of quantitative maps of material properties.
Kristin Davis is recounting the doubly frustrating experience of being ghosted by a man she was dating — after lending him money which he never paid back. After Wynter, 51, opened up about her ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
AFM-IR enables nanoscale infrared spectroscopy, [52] i.e. the ability to obtain infrared absorption spectra from nanoscale regions of a sample. Chemical compositional mapping AFM-IR can also be used to perform chemical imaging or compositional mapping with spatial resolution down to ~10-20 nm, [18] limited only by the radius of the AFM tip. In ...