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Plasma etching can change the surface contact angles, such as hydrophilic to hydrophobic, or vice versa. Argon plasma etching has reported to enhance contact angle from 52 deg to 68 deg, [7] and, Oxygen plasma etching to reduce contact angle from 52 deg to 19 deg for CFRP composites for bone plate applications. Plasma etching has been reported ...
The plasma produces energetic free radicals, neutrally charged, that react at the surface of the wafer. Since neutral particles attack the wafer from all angles, this process is isotropic. Plasma etching can be isotropic, i.e., exhibiting a lateral undercut rate on a patterned surface approximately the same as its downward etch rate, or can be ...
The de-smear process ensures that a good connection is made to the copper layers when the hole is plated through. On high reliability boards a process called etch-back is performed chemically with a potassium permanganate based etchant or plasma etching. The etch-back removes resin and the glass fibers so that the copper layers extend into the ...
Reactive-ion etching (RIE) is an etching technology used in microfabrication. RIE is a type of dry etching which has different characteristics than wet etching. RIE uses chemically reactive plasma to remove material deposited on wafers. The plasma is generated under low pressure by an electromagnetic field.
Plasma processing is a plasma-based material processing technology that aims at modifying the chemical and physical properties of a surface. [1] Plasma processing techniques include: Plasma activation; Plasma ashing; Plasma cleaning; Plasma electrolytic oxidation; Plasma etching; Plasma functionalization; Plasma polymerization; Corona treatment ...
Download as PDF; Printable version ... The underlying process is the ... and integrated circuit manufacturing industries for plasma etching and plasma enhanced ...
Download QR code; Print/export Download as PDF; Printable version; In other projects ... Plasma etching; Plasma gasification commercialization;
Dry etching refers to the removal of material, typically a masked pattern of semiconductor material, by exposing the material to a bombardment of ions (usually a plasma of reactive gases such as fluorocarbons, oxygen, chlorine, boron trichloride; sometimes with addition of nitrogen, argon, helium and other gases) that dislodge portions of the material from the exposed surface.