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Program execution; General concepts; Code; Translation. Compiler. Compile time; Optimizing compiler; Intermediate representation (IR); Execution. Runtime system. Runtime
The hardware fault injection method consists in real electrical signals injection into the DUT (devices under testing) in order to disturb it, supposedly well working, at hardware low level, and deceive the control - detection chain (if present) in order to see how and if the fault management strategy is implemented.
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
ECLAIR – Uses formal methods-based static code analysis techniques such as abstract interpretation and model checking combined with constraint satisfaction techniques to detect or prove the absence of certain run time errors in source code. ESC/Java and ESC/Java2 – Based on Java Modeling Language, an enriched version of Java
Fault tolerance executing the same instructions redundantly in order to detect and mask errors, in a manner known as task replication, may be considered to belong to this type. Applications for this architecture are much less common than MIMD and SIMD , as the latter two are often more appropriate for common data parallel techniques.
In this example, we shall encode 14 bits of message with a 3-bit CRC, with a polynomial x 3 + x + 1. The polynomial is written in binary as the coefficients; a 3rd-degree polynomial has 4 coefficients (1x 3 + 0x 2 + 1x + 1). In this case, the coefficients are 1, 0, 1 and 1.
All error-detection and correction schemes add some redundancy (i.e., some extra data) to a message, which receivers can use to check consistency of the delivered message and to recover data that has been determined to be corrupted.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.