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A twin boundary is a defect that introduces a plane of mirror symmetry in the ordering of a crystal. For example, in cubic close-packed crystals, the stacking sequence of a twin boundary would be ABCABCBACBA. On planes of single crystals, steps between atomically flat terraces can also be regarded as planar defects.
On the microscopic level, the twin boundary is characterized by a set of atomic positions in the crystal lattice that are shared between the two orientations. [ 1 ] [ 2 ] These shared lattice points give the junction between the crystal segments much greater strength than that between randomly oriented grains, so that the twinned crystals do ...
The material point method (MPM) is a numerical technique used to simulate the behavior of solids, liquids, gases, and any other continuum material. Especially, it is a robust spatial discretization method for simulating multi-phase (solid-fluid-gas) interactions.
In crystallography, a vacancy is a type of point defect in a crystal where an atom is missing from one of the lattice sites. [2] Crystals inherently possess imperfections, sometimes referred to as crystallographic defects. Vacancies occur naturally in all crystalline materials.
Garbe et al. [19] have introduced a multi-stage anomaly detection framework that improves upon traditional methods by incorporating spatial clustering, density-based clustering, and locality-sensitive hashing. This tailored approach is designed to better handle the vast and varied nature of IoT data, thereby enhancing security and operational ...
Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]
The time frequency approach for machine fault diagnosis can be divided into two broad categories: linear methods and the quadratic methods. The difference is that linear transforms can be inverted to construct the time signal, thus, they are more suitable for signal processing, such as noise reduction and time-varying filtering.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.