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  2. Network Investigative Technique - Wikipedia

    en.wikipedia.org/wiki/Network_Investigative...

    Network Investigative Technique (NIT) is a form of malware (or hacking) employed by the FBI since at least 2002. It is a drive-by download computer program designed to provide access to a computer. Controversies

  3. Test card - Wikipedia

    en.wikipedia.org/wiki/Test_card

    Test cards typically contain a set of patterns to enable television cameras and receivers to be adjusted to show the picture correctly (see SMPTE color bars).Most modern test cards include a set of calibrated color bars which will produce a characteristic pattern of "dot landings" on a vectorscope, allowing chroma and tint to be precisely adjusted between generations of videotape or network feeds.

  4. Nitrite test - Wikipedia

    en.wikipedia.org/wiki/Nitrite_test

    A nitrite test is a standard component of a urinary test strip. A positive test for nitrites in the urine is called nitrituria. This test is commonly used in diagnosing urinary tract infections (UTIs). A positive nitrite test indicates that the cause of the UTI is a Gram-negative organism, most commonly Escherichia coli. The reason for nitrites ...

  5. NIT MCA Common Entrance Test - Wikipedia

    en.wikipedia.org/wiki/NIT_MCA_Common_Entrance_Test

    The NIT MCA Common Entrance Test (NIMCET), is a National Level Test conducted by NITs for admission to their Master of Computer Applications (MCA) programme.The admission to the MCA programme to the nine NITs at Agartala, Allahabad, Bhopal, Jamshedpur, Kurukshetra, Raipur, Surathkal, Tiruchirappalli (Trichy), Warangal, Patna and IIIT Bhopal for the year 2024-25 is based on the Rank obtained in ...

  6. Universal Electronic Test Chart - Wikipedia

    en.wikipedia.org/wiki/Universal_Electronic_Test...

    Experimental broadcasts using the first three prototype versions of the UEIT (one of which was a modification of the Hungarian HTV TR.0782 test card; [9] but all were collectively referred to as UEIT-1) began from the Ostankino Tower transmitter in 1970, with results being used to create the current version of the test pattern.

  7. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

  8. High-dynamic-range television - Wikipedia

    en.wikipedia.org/wiki/High-dynamic-range_television

    Standard dynamic range (SDR) is still based on and limited by the characteristics of older cathode-ray tubes (CRTs), despite the huge advances in screen and display technologies since CRT's obsolescence. [1] SDR formats are able to represent a maximum luminance level of around 100 nits. For HDR, this number increases to around 1,000–10,000 nits.

  9. Philips circle pattern - Wikipedia

    en.wikipedia.org/wiki/Philips_circle_pattern

    Rather than previous test card approaches that worked by a live camera or monoscope filming a printed card, the Philips PM5544 generates the test patterns fully using electronic circuits, with separate paths for Y, R-Y and B-Y colour components [2] (′), allowing engineers to reliably test and adjust transmitters and receivers for signal ...