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Electromigration (red arrow) is due to the momentum transfer from the electrons moving in a wire. Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms.
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field.
The language of mathematics has a wide vocabulary of specialist and technical terms. It also has a certain amount of jargon: commonly used phrases which are part of the culture of mathematics, rather than of the subject.
This means by definition that the connection ∇ is flat there. In mentioned Aharonov–Bohm effect, however, the connection depends on the magnetic field through the tube since the holonomy along a non-contractible curve encircling the tube is the magnetic flux through the tube in the proper units. This can be detected quantum-mechanically ...
The classical electron radius is a combination of fundamental physical quantities that define a length scale for problems involving an electron interacting with electromagnetic radiation. It links the classical electrostatic self-interaction energy of a homogeneous charge distribution to the electron's relativistic mass-energy.
eFuses can be made out of silicon or metal traces. In both cases, they work (blow) by electromigration, the phenomenon where electric flow causes the conductor material to move. Although electromigration is generally undesired in chip design as it causes failures, eFuses are made of weak traces that are designed to fail before others do. [3] [4]
Domain-specific terms must be recategorized into the corresponding mathematical domain. If the domain is unclear, but reasonably believed to exist, it is better to put the page into the root category:mathematics, where it will have a better chance of spotting and classification. See also: Glossary of mathematics
Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration .