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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs M. von Ardenne's first SEM SEM with opened sample chamber Analog type SEM. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.

  3. Structural equation modeling - Wikipedia

    en.wikipedia.org/wiki/Structural_equation_modeling

    Structural equation modeling (SEM) is a diverse set of methods used by scientists for both observational and experimental research. SEM is used mostly in the social and behavioral science fields, but it is also used in epidemiology, [2] business, [3] and other fields. A common definition of SEM is, "...a class of methodologies that seeks to ...

  4. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    This is analysis that can be performed virtually anywhere. Consequently, the largest roadblock is acquiring a high-resolution, aberration-corrected scanning transmission electron microscope that can provide the images necessary to provide accurate quantification of structural properties at the atomic level.

  5. Spectral element method - Wikipedia

    en.wikipedia.org/wiki/Spectral_element_method

    In the numerical solution of partial differential equations, a topic in mathematics, the spectral element method (SEM) is a formulation of the finite element method (FEM) that uses high-degree piecewise polynomials as basis functions. The spectral element method was introduced in a 1984 paper [1] by A. T. Patera. Although Patera is credited ...

  6. Electron beam-induced current - Wikipedia

    en.wikipedia.org/wiki/Electron_beam-induced_current

    Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties.

  7. WarpPLS - Wikipedia

    en.wikipedia.org/wiki/WarpPLS

    WarpPLS is a software with graphical user interface for variance-based and factor-based structural equation modeling (SEM) using the partial least squares and factor-based methods. [1] [2] The software can be used in empirical research to analyse collected data (e.g., from questionnaire surveys) and test hypothesized relationships.

  8. Energy-dispersive X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Energy-dispersive_X-ray...

    Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...

  9. SmartPLS - Wikipedia

    en.wikipedia.org/wiki/SmartPLS

    [6] [7] The software computes standard results assessment criteria (e.g., for the reflective and formative measurement models and the structural model, including the HTMT criterion, bootstrap based significance testing, PLSpredict, and goodness of fit) [8] and it supports additional statistical analyses (e.g., confirmatory tetrad analysis ...