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  2. Profilometer - Wikipedia

    en.wikipedia.org/wiki/Profilometer

    Non-Contact Optical Profilometer A contact profilometer at LAAS technological facility in Toulouse, France. A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography.

  3. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    they can measure surfaces through transparent medium such as glass or plastic film; non-contact measurement may sometimes be the only solution when the component to measure is very soft (e.g. pollution deposit) or very hard (e.g. abrasive paper). Vertical scanning: Coherence scanning interferometry; Confocal microscopy; Focus variation

  4. Surface finish - Wikipedia

    en.wikipedia.org/wiki/Surface_finish

    Surface finish may be measured in two ways: contact and non-contact methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers . Non-contact methods include: interferometry , confocal microscopy , focus variation , structured light , electrical capacitance , electron microscopy ...

  5. Optical flat - Wikipedia

    en.wikipedia.org/wiki/Optical_flat

    Absolute flatness is the flatness of an object when measured against an absolute scale, in which the reference flat (standard) is completely free of irregularities. The flatness of any optical flat is relative to the flatness of the original standard that was used to calibrate it. Therefore, because both surfaces have some irregularities, there ...

  6. Autocollimator - Wikipedia

    en.wikipedia.org/wiki/Autocollimator

    An autocollimator is an optical instrument for non-contact measurement of angles. They are typically used to align components and measure deflections in optical or mechanical systems. An autocollimator works by projecting an image onto a target mirror and measuring the deflection of the returned image against a scale, either visually or by ...

  7. White light interferometry - Wikipedia

    en.wikipedia.org/wiki/White_light_interferometry

    The interference occurs for white light when the path lengths of the measurement beam and the reference beam are nearly matched. By scanning (changing) the measurement beam path length relative to the reference beam, a correlogram is generated at each pixel. The width of the resulting correlogram is the coherence length, which depends strongly ...

  8. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    SKP has been used to investigate the surface potential of materials used in solar cells, with the advantage that it is a non-contact, and therefore a non-destructive technique. [28] It can be used to determine the electron affinity of different materials in turn allowing the energy level overlap of conduction bands of differing materials to be ...

  9. Flatness (manufacturing) - Wikipedia

    en.wikipedia.org/wiki/Flatness_(manufacturing)

    In manufacturing and mechanical engineering, flatness is an important geometric condition for workpieces and tools. Flatness is the condition of a surface or derived median plane having all elements in one plane. [1] Geometric dimensioning and tolerancing has provided geometrically defined, quantitative ways of defining flatness operationally.

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