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Electron tomography is an extension of traditional transmission electron microscopy and uses a transmission electron microscope to collect the data. In the process, a beam of electrons is passed through the sample at incremental degrees of rotation around the center of the target sample. This information is collected and used to assemble a ...
electron-electron scattering Bhabha scattering: electron-positron scattering Penguin diagram: a quark changes flavor via a W or Z loop Tadpole diagram: One loop diagram with one external leg Self-interaction or oyster diagram An electron emits and reabsorbs a photon Box diagram The box diagram for kaon oscillations: Photon-photon scattering
As in other electron tomography techniques, the sample is tilted to different angles relative to the electron beam (typically every 2-3 degrees from about −60° to +60°), and an image is acquired at each angle. [5] This tilt-series of images can then be computationally reconstructed into a three-dimensional view of the object of interest. [6]
As the electron beam passes through the sample, some electrons in the beam lose energy via inelastic scattering interactions with electrons in the sample. In electron energy loss spectroscopy (EELS), the energy lost by the electrons in the beam is measured using an electron spectrometer, allowing features such as plasmons, and elemental ...
Electron beam computed tomography (EBCT) is a fifth generation computed tomography (CT) scanner in which the X-ray tube is not mechanically spun in order to rotate the source of X-ray photons. This different design was explicitly developed to better image heart structures that never stop moving, performing a complete cycle of movement with each ...
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...
Selected area (electron) diffraction (abbreviated as SAD or SAED) is a crystallographic experimental technique typically performed using a transmission electron microscope (TEM). It is a specific case of electron diffraction used primarily in material science and solid state physics as one of the most common experimental techniques.
Charge coupled device (CCD) cameras were first applied to transmission electron microscopy in the 1980s and later became widespread. [3] [4] For use in a TEM, CCDs are typically coupled with a scintillator such as single crystal Yttrium aluminium garnet (YAG) in which electrons from the electron beam are converted to photons, which are then transferred to the sensor of the CCD via a fiber ...